Realtek Collaborates with Rohde & Schwarz to Complete Industry’s First End-to-End Test Solution for Bluetooth® LE High Data Throughput (HDT)
Realtek Semiconductor and Rohde & Schwarz, a global leader in test and measurement, have successfully validated the industry’s first end-to-end test solution for the next-generation Bluetooth® LE High Data Throughput (HDT) feature, marking a critical milestone from standard definition to mass-production readiness. Leveraging the Rohde & Schwarz CMP180 radio communication tester, the two partners have completed full characterization and rigorous validation of Realtek’s next-generation Bluetooth solutions, the RTL8922D and RTL8773J, delivering a one-stop verification capability spanning R&D, pre-conformance, and high-volume manufacturing.